CN

Technological

KLA 8520 Defect Inspection
KLA 8520 Defect Inspection
ICP-MS Metal Detection
ICP-MS Metal Detection
KLA 20 Electron Microscope
KLA 20 Electron Microscope
X-ray Orientation Instrument
X-ray Orientation Instrument
3D Topography Measuring Instrument
3D Topography Measuring Instrument
Wafer Internal Stress Detector
Wafer Internal Stress Detector
Large Field of View Microscope
Large Field of View Microscope
AFM - Roughness Inspection
AFM - Roughness Inspection
Spotlight
Spotlight
Full-disc TTV Inspection
Full-disc TTV Inspection
Special R&D & Experimental Line for Cleaning Equipment
Special R&D & Experimental Line for Clea…
Diamond Wire Rapid Cutting Technology for Silicon Carbide & Gallium Nitride Crystal Materials
Diamond Wire Rapid Cutting Technology fo…